SkyScan 1275: Fast, Automated, Desktop X-ray Micro-CT Scanner
The SkyScan1275 micro-CT is specially designed for 3D high speed imaging without compromising image quality. Using new X-ray source technology and efficient flat-panel detectors, the Skyscan 1275 micro-CT reduces scan times down to a few minutes for routine sample scanning at the push of a button.
Fast micro-CT scanning with high quality results is crucial for scientific research and industrial applications such as quality control, production process monitoring, and large sample sets. The SkyScan1275 micro-CT provides a high level of automation; a simple push of the button on the front of the system starts an auto-sequence of a fast scan followed by reconstruction and volume rendering executed during scanning of the next sample. Great for routine samples!
Fast realistic visualization of the microstructure through the Bruker CTVox volume rendering software enables fabulous imaging with the ability to virtually cut or fly around the inside of objects. The Bruker CT Analysis software is a powerful analytical package that turns the 1275 Micro-CT into an advanced analytical tool for your research.
If you aren’t sure if a micro-CT system will work for your application, Micro Photonics’ micro-CT experts are happy to help you with that question. We have over 40+ years combine micro-CT experience which we can apply to your sample. If you would like to send in a sample for a free micro-CT evaluation you can do so through our extensive laboratory. Click here for the free evaluation.
See more details and application examples in the product brochure.
Want more information? Call Ben at (610) 366-7103 or email: email@example.com
|X-ray source||20-100 kV, 10 W, < 5 µm spot size @ 4 W|
|X-ray detector||3Mp (1944×1536 pixels) active pixel CMOS flat panel|
|Maximum object size||96 mm diameter, 120 mm height|
|Reconstruction||GPU-accelerated FDK reconstruction as standard|
|Optional stages||micro-positioning, cooling, heating, compression/tension (more)|
|Radiation safety||<1 µSv/h at any point on the instrument surface|