1-866-334-4MPI (4674)
High Throughput Laue Diffraction System
High-throughput single crystal orientation measurements, utilizing the Laue Diffraction technique, measurements can be performed in as little as a few seconds. The system is designed for heavy duty “round the clock” operation. Easy access maintenance features are designed to keep you up and running year after year. Excellent for nickel-based alloy single crystal orientation turbine blade inspection.
Options
X-ray Detector
Sample Handling
Cabinet
Motorized Sample Positioning
3D Joystick for Matching Overlays
Back Reflection Laue Detector
Contact Micro Photonics for more information at 610-366-7103 or info@microphotonics.com
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Laue-HT
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Dimensions
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50 x 35 x 78 inches
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Power Requirements
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220-240V, 30 Amp 50/60Hz, Single Phase
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X-ray Tube
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Tungsten (W)
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X-ray Power Supply
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3000 W
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| Geometry | Side reflection or Back reflection (optional) |
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Camera
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75mm diameter, scintillation based intensified CCD (side reflection) 80×80 mm, scintillation based intensified CCD (back reflection option) |
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Sample Positioning
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Automated X axis (200 mm), Y axis (175 mm), Z axis manual (200mm)
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Goniometers
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n/a
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X-ray Beam Apertures
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0.5, 0.8, 1.0, 1.2, 1.6, 2.0 mm
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Cabinet Door Option
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light curtain, Manual Door, automated door
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Computer
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Desktop Computer included
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Software
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PROTO XRDWIN 2.0 Laue
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System Compliance
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ANSI N43.2, CE
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Cabinet Features
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Independent warning light beacons for ‘X-ray On’ and ‘Shutter Open’ Emergency stop with lockout key, enclosure light, fully interlocked, clear view windows, hand-held motion control pendant |
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Software
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Image capture
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DNR’s GelCapture, free lifetime upgrade
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1D image analysis
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GelQuant Express
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Optional: GelQunat Pro
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We work with you to make it possible, helping you through the process.
