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Position
Measurement Sensors |
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 White
Light Chromatic Aberration Interferometric Sensors |
Positioning of wide range of materials with a resolution down to 1nm and displacement up to 24mm |
| Guide to other sections of this site |
| 3D Non Contact Profilometry - Profilometry, X ray tomography and acoustic microscopy |
| Non Destructive Testing - Profilometry, X ray tomography and acoustic microscopy |
| Surface and Micro Mechanical Testing - Indenters, scratch testers, tribometers, force gauges, thickness measurement. |
| On-line information request form |
  infoca@microphotonics.com |
| [Return to Micro Photonics home page]
For Further information fill out our on-line request form or contact us at 1-866-333-4674: Micro Photonics Inc. Micro Photonics Inc. |
