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Nanovea PS50/ 3D Non-Contact Profiling

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MicroTopography / Surface Roughness / Dimensional Metrology
Film Thickness Measurements / Form and Texture Surface Analysis
Precision Machining Quality Control / Industrial Surface Testing

Features of Nanovea PS50

  • Best choice to replace contact profilers
  • Fast non-contact technique
  • Affordably priced
  • Compact and easily portable apparatus
  • No sample preparation
  • Interchangeable optical measuring pens
  • Accepts a wide range of materials
  • 2D & 3D profiles
  • Rough or polished surfaces

Laboratory services available. Call 1-866-333-4674 for more information.

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See our full range of profilometers and roughness testers

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Introduction to the Nanovea PS50 Non-Contact Profiler
Nanovea PS50 Non-Contact Profiler is a compact, portable system that allows users to easily interchange pens to suit the application. Using white light & the unique chromatic aberration technique, which has been shown to be much better than laser techniques in measuring roughness, this profiling system can provide some of the same benefits of our more expensive systems, but at a much lower price tag.

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For Further information contact us at 1-866-333-4674: 

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