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Nanovea ST400 / 3D Non-Contact Profiling

"Industry Leader in its class"
MicroTopography / Surface Roughness / Dimensional Metrology
Film Thickness Measurements / Form and Texture Surface Analysis
Precision Machining Quality Control / Industrial Surface Testing

Laboratory services available

See our full range of profilometers and roughness tester

Features of Nanovea ST400

  • Fast Non-Contact Technique
  • Economical Design
  • No Sample Preparation
  • High Z Axis Dynamic Range up to 27mm
  • High Z Resolution down to 2nm
  • Optical Lens Video/Microscope with various magnifications (option)
  • Able to Measure on Transparent Surfaces
  • Accepts a Wide Range of Materials
  • Rough or Polished Surfaces
  • Transparent or opaque objects
  • Ideal for metal, glass, wood, synthetic materials, scientific and ophthalmic optics, plastics, coatings, paints and varnishes, paper, human skin, hair, teeth...

Nanovea PS50 Compact Non-Contact Profilometer

Nanovea DS700 Dual Scanner for thickness measurement

Browse through more than 80 applications!

 

Nanovea ST400 Non-Contact Optical Profiler uses white light & the unique chromatic aberration technique. This technique has shown to be much better than laser techniques in measuring roughness. With accuracy in the nanometer range and a maximum measuring height range of up to 27mm, the Nanovea ST400 has the unique capability of not only be able to do very accurate roughness measurements but also can do dimensional measurements on the same instrument. Chromatic aberration technique has also the advantages of working for high angular slope conditions (up to 80degree for specular surfaces) and on samples with low reflectivity. Therefore the Nanovea ST400 works for a wider variety of applications compared to white light interferometry /phase shift and laser techniques. The Nanovea VS200 is a variation seen below that allows larger tables up to 300mm, rotation stage and other custom systems.

All systems are equipped with two powerful complementary software. A user-friendly software allows easy setup of parameters such as the scan size, the number of lines, the step size, the translation stages speed, the data acquisition rate, the selected probe.

The ULTRA, EXPERT and PROFESSIONAL version of 3D MOUNTAINS MAP data post-processing software allows a lot of surface and profile analysis and studies like : Abbott-Firestone curve, FFT, auto correlation function, 3D representation, slices and much more.

 
Options including Pen Turret, Video Zoom, microscope & AFM and Advanced Machine Vision
Multi-Pen Turret: A multi-pen turret can now be added to the Nanovea ST400 and VS200. By combining up to 3 magnifiers and 3 chromatic lenses, the user can now easily switch between 9 Optical Pen configurations. These configurations could vary in their working distance, measurement range, spot size, or resolution depending on which combination is chosen. Call for more details. - Video Zoom System (fixed or multiple): Select area, or areas, of interest and the 3D software will automatically scan the position for height information. - Rotative Table and Bore Applications: The ST-400 can come with a rotative table for special applications. A 90degree optical pen can also be used to image the inside of bore. Please call us for your specific applciation.
- Video Microscope with Turret: A full microscope can be installed for highly detailed studies at high magnifications, up to 1000x.. This allows installation of a AFM (Atomic Force Microscope) for studying areas at even higher magnifications than possible with the light system.

-Stationary Samples: Special adaptation can be made so the optical pen is moved over the sample instead of the countrary.

The pen can either scan at 90 degree or directly over the sample.

Applications such as test of asphalt requires these changes.

 - ILIS Infrared Sensor: Adding an infrared sensor to your ST-400 will allow measurement through thicker more opaque materials such as plastics, glasses (transparent or semi-transparent). With this technique it is also possible to measure the thickness of silicon wafers to 0.1micron resolution. Please call us to discuss your applications.
- Machine Vision Software: Image recognition software can be programmed to scan the sample with light sensors and produce depth/volume information. This is very useful to scan larger surfaces when looking for scratches or pits on the surface. Call us to discuss your specific applications.    

 

Specifications of Nanovea ST400
X & Y Motorized Table Range 150mm (other sizes available upon request)
Z Axis Range 20mm (manual micrometer to come inside the working distance, motorized optional)
Maximum Data Collection Rate Up to 30,000 points/second 
Maximum X,Y Axis speed 20 mm/sec

 

   Optical Measuring Pen- Description

Optical Measuring Pen - Specifications

Choice of several interchangeable displacement probes to fit Nanovea Profilers.
Measurement Range
Working Distance (mm)
Axial Resolution (nm)
Axial Accuracy (nm)
Spot Diameter (µm)
Lateral Resolution (µm)

Slope (°)

up to 80° for specular surfaces

Min Measurable Thickness (µm)
20µm
0.37
2
10
3

1.5
48
12
130µm
3.3
5
20
2
1.1
43
7
300µm
5.68
10
90
7.4
3.7
25
25
350µm
12.7
10
60
7
3.5
27
25
400µm
11
12
60
2.6
1.3
28
15
1mm
23.9
30
300
14 6
6
24
23
1.2mm
12.7
25
200
4
2
27
25
3mm
26.9
100
600
25
12.5
12
220
3.5mm
16.4
75
400
8
4
22
60
10mm
66.9
300
900
51
25.5
12
425
12mm
29
280
900
16
8
14
200
24mm
222.3
1500
3000
100
50
5
1570
27mm
19.6
600
3000
16
8
8.6
590

2µm - 100µm (Interferometric)
42
10
100
20
10
7
2
infoca@microphotonics.com 

 

For contacts outside North America

 

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For Further information fill out our on-line request form or contact us at 1-866-333-4674: 

Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129