For Immediate Release

Contact: Julie Guaderrama-Bascopé

Marketing Manager

Phone (949) 461-9292, julie@microphotonics.com

 

Irvine, California – January 18, 2007 - Micro Photonics Inc. today introduced new Sarfus technology. Developed by Nano Lane, this powerful new optical quantitative imaging technique creates highly precise 3D thickness, dimensional, roughness, profile and step height measurements at the nanometer scale.
                                   
Sarfus technology is based on the perfect control of the reflection properties of polarized light on a Surf (specific supporting plates where the sample is deposited), which leads to an increase in the axial sensitivity of the optical microscope by a factor approximately 100 without reducing lateral resolution. 

Using an upright optical microscope, and specific supporting sample plates called Surfs, a white light beam passes through a linear polarizer which produces a linear polarized light that is reflected by the Surf supporting the sample. The sample induces a change of the polarization state, and when the reflected beams pass through an analyzer crossed with the polarizer, the light reflected from the surf is stopped, whereas the light reflected from the sample passes through.  An infinitesimal quantity of matter deposited on the surface of the Surf changes the property (i.e. modifies the polarization state) and reveals the sample. 

The resulting high contrast images allow direct observation of nano metric thickness films or nano metric diameter objects.  2D images can be converted into highly precise 3D metrological images, dimensional accuracy (<1nm). Roughness, profile extraction and step height measurements are easily imaged as well.

The key to Sarfus technology lies in the Surf.  Surfs are contrast enhancing supports on which samples are deposited, and can be used in either an air or liquid environment, The specific optical properties can be manipulated by controlling the layers deposited on the substrate, which can be customized with specific top layers such as SiO2, Au, Cr or Al.

Current and potential applications include biomedical studies such as: rapid defect visualization of softlithography, real time visualization and dynamic study of phospholipids, and quality control and thickness measurement determination of DNA biochips.  Thin films and surface treatment studies include characterizing layer homogeneity of organic steps, direct visualization and height deposition measurements of plasma, dynamic studies of crystallization and wetting applications.  As well as direct behavior and morphology characterization of nanotubes and nanowires, and direct visualization of nanolithography patterns with quality control of the deposition process.

Sarfus technology can be either integrated onto an existing microscope with a ‘plug and play’ solution or purchased as part of a total acquisition system.   Clients who wish to purchase a complete system have the option between the economical Sarfus VISU and comprehensive Sarfus 3D system.

Micro Photonics has been a leading provider of materials technology instruments and laboratory testing since 1992.  The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometry, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.

For further information contact Julie Guaderrama-Bascopé (866) 334-4MPI, julie@microphotonics.com.