For Immediate Release

Contact: Julie Guaderrama-Bascopé,

Marketing Communications Coordinator

949-461-9292 phone, julie@microphotonics.com

 

Irvine, California – March 24, 2006 – Micro Photonics Inc. today introduced the latest line of confocal chromatic optical pens for profilometry, microtopography, roughness, auto-focus vibrometery, in-line inspection quality control, and thickness measurements.

The new modular design allows up to 30 different optical pen configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency. Users can choose from a selection of five magnifiers, ranging from 3.3mm to 29mm focal lengths, and six different chromatic lenses, 130µm to 27mm depth of fields. Pens can achieve maximum axial resolution of 5nm, accuracy to 20nm and max slope to 87º for diffusive objects.

Based on white light chromatic aberration, the pens have superior lateral resolution (1.1µm) and vertical resolution (5nm); which make them a better choice than laser triangulation sensors for applications where high resolution measurements are critical, as sometimes found in vibrometry, in-line inspection and quality control applications. For challenging materials such as, textiles, polymers, black or dark blue materials, high aspect ratio surfaces, and materials of low reflectivity, white light chromatic aberration is often the only appropriate technique.

Micro Photonics believes new competitive pricing will attract clients who previously considered white light chromatic aberration too expensive. “Clients have known of this technique, and its benefits for OEM applications, but because of the price it was passed on in favor of cheaper laser sensors. The new prices are 40% lower on average, which will make a difference.” said Pierre Leroux, General Manager, Surface Test Division.