CONTACT: JULIE GUADERRAMA (949) 461-9292
WHAT: MICRO PHOTONICS SHOWCASES NEW, BREAKTHROUGH INSTRUMENTATION AT SPIE
WHERE: SAN DIEGO CONVENTION CENTER, BOOTH 725
DATE: AUGUST 2-4, 2005
Micro Photonics is showcasing several new instruments at this year's SPIE show in San Diego. On display will be the Photomap Profiler with Stroboscopic MEMS Option and Environmental MEMS Chamber for Static and Dynamic MEMS Testing, and the Micromeasure Plus Profiler.
The Photomap Profiler with Stroboscopic MEMS Option allows in-plane and out-of-plane real time vibration mode studies from 100Hz to 2MHz. Ideal for 3D real-time studies of MEMS and Membranes in real operation modes, this option is an essential tool for those wishing to observe stroboscopic deformation.
Specifically designed to give full control of environmental conditions, while performing stroboscopic interferometric microscopy, the Environmental MEMS Chamber is the most comprehensive option for in-plane and out-of-plane MEMS characterization. Users have the ability to perform electrical and mechanical testing as a function of environmental parameters such as temperature (-25°C to +65°C), varying gases or vacuum to 10 -6 millibars. A full range of MEMS studies can be performed in electro-static, piezo or thermal actuation.
Also on display will be the Micromeasure Plus Profiler, which uses the unique chromatic aberration technique. This technique allows scans of lenses with a high degree of curvature, which is impossible with other techniques. The instrument has also the ability to map the thickness of lenses by receiving simultaneous signal from both side of the lenses.
This exclusive technology will be on display by Micro Photonics Inc. at SPIE in San Diego, CA booth 725. Micro Photonics has been a leading supplier for materials technology instruments and laboratory testing for over a decade. The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometry, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.