For Immediate Release

Contact: Julie Guaderrama-Bascopé

Marketing Communications Coordinator

Phone (949) 461-9292, julie@microphotonics.com

Irvine, California – January 25, 2005 – Micro Photonics Inc., a leading provider of surface materials instruments and laboratory services, offers new opportunities for SPM testing. The MultiView 3000 is the first commercially available, dual probe SPM platform of it's kind.

Comprised of three separate plates, two specialized and independently controlled probes scan the same sample simultaneously. The probes housed in the upper and middle plates fold compactly onto the bottom plate, holding the sample and FlatScan Scanner. An additional FlatScan Scanner, also held by the middle plate creates an encasement around the test sample. Folded flat, the stage will fit under any optical microscope. The tri-fold design allows researchers to switch probes without disturbing the sample.

As many as three 3D FlatScan Scanners work independently with the tips, and can be manipulated for multiple sample scanning configurations. The planer, folded-piezo, and flexure design allow the FlatScan simultaneous lateral and axial sample scanning, and provide coarse inertial positioning options. Resolution range is over 140 microns in the x, y plane, and 70 microns on the z plane; the system retains a completely free central axis.

The innovative MultiView 3000 design, combined with its ability to employ two specialist SPM probes opens the door to exciting new research possibilities. For the first time scientists may be able to: use a thermal SPM as a nano-heating element while scanning a different topographic area of the same sample and map changes. Illuminate a precise point and scan a separate area to study temperature changes or

other physical properties. Use two NSOM probes in conjunction, one for illumination the other for collection. Thusly, optical scattering, absorption and transmission properties can be measured in PBGs and nanometric waveguides.

Further application possibilities include Nano-Indentation. Scientists can measure the expansion dynamics during indentation tests without moving the sample. Alterations in thermal conductivity or electrical resistance can be measured relative to the indentations with spatial nano-metric control and microsecond time evolution. The MultiView 3000 supports all standard nano-indentation parameters and protocols, and can employ a wide variety of nano-indentors.

This exclusive technology is available from Micro Photonics Inc. Micro Photonics has been a leading supplier for materials technology instruments and laboratory testing for over twelve years. The company specializes in: Nano and Micro Mechanical Testing, X-Ray Micro Tomography, Ellipsometery, X-Ray Diffraction, 3D Non-Contact Profilometry, Thin Film Analysis, Biological Imaging Instruments and NSOM, SPM & AFM systems.

For further information regarding any of these instruments please contact Julie Guaderrama-Bascopé (866) 334-4MPI or at julie@microphotonics.com.