For Immediate Release

Contact: Julie Guaderrama-Bascopé

Marketing Communications Coordinator

Phone (949) 461-9292, julie@microphotonics.com

Irvine, California – May 27, 2004– Micro Photonics, Inc. today announced the latest additions to its surface metrology product line: The MultiView 1000™, MultiView 400™, Academia System™, CryoView 2000™ AFM/NSOM and SPM Microscopy Systems. The award winning Microscopy Systems are fully modular and are available with a wide range of probes including a NanoPen, which can deliver chemical and molecular nanoparticles to specific nanometric areas.

The MultiView 1000™ offers simultaneous NSOM/AFM/Confocal Imaging, and is the first of its kind to integrate all forms of scanned probe microscopy with conventional optical microscopy. Designed around patented 3D Flatscan™ scanner technology, the instrument can be combined with any inverted, upright, or dual optical microscope.

A key feature of the MultiView 1000™ is its modularity, because the system readily sits on the sample stage of any conventional far-field microscope, and is compatible with most commercial control systems, users can incorporate the MultiView 1000™ into pre-existing microscopy systems.

Researchers can expect an extensive collection of standard features with the MultiView 1000™ including: piezoelectric flat scanner (7mm thickness) with a scan range of 70µm, X/Y range 30µm, inertial piezo motion with accuracy of 1 micron, cantilevered pulled glass probe, Quartz Software for MultiView

Controller (Win 95/98, NT and XP). Real time image display, image acquisition (up to 8 channels) and analysis, 3D rendering, or LabView based software.

The MultiView 400™ incorporates a free optical axis from both above and below the sample and can be moved between different host microscopes allowing for completely integrated microscopy. Using standard AFM or specialized probes including: thermocouple probes, electrical probes, nanopipette probes, nanoheater probes and coaxial probes the wide range of options allow the researcher to design a completely custom system.  

The capabilities of the MultiView family of instruments include: liquid cell studies, low temperature capabilities to 10K, Nanochemical and Gas Delivery System, which can deliver gases and chemicals to micron-sized points on a sample with nanometer precision, 3D Nano-Lithography at nanometer dimensions, NSOM measurements and Confocal Microscopy.

The Academia System™ is an affordable research grade AFM system designed to offer similar features of other more expensive systems at a less expensive price. Standard equipment includes an AFM controller; LabVIEW based software, computer and binocular optical microscope for viewing the sample during the scanning process, free optical access from above and a scan range of 70µm XY, 5µm Z. Affordability is the key aspect to the Acadamia™ presenting a high quality research grade AFM System at an affordable price tag. In addition, customized fiber probes are produced to customer specifications.

Micro Photonics offers contract laboratory testing services, instruments, after-sales service and training for a wide range of surface metrology instruments including: nano/micro mechanical testing, friction, wear, adhesion, scratch resistance and fracture toughness. Ellipsometers are available for thin film thickness and optical properties (n&k), and a large array of non-contact surface profiling instruments for studying roughness, dimensional analysis, and radius of curvature and thickness properties. In addition, Micro Photonics offers x-ray microtomograghy instruments for imaging and analyzing internal microstructures

For further information regarding any of these instruments please contact Julie Guaderrama-Bascopé (949) 461-9292, or at julie@microphotonics.com.