Nano Scratch Tester

• Ultra-high resolution scratch testing apparatus
• Normal force up to 500 mN
• Real Time Display of  frictional force and depth curve  
• Automated optical microscopic inspection before and after testing 
• Optional integrated AFM/SPM objective
• Optional Temperature Control 400^oC
• Unique IBIS Technology with feedback system allowing measurement of curved surfaces
• Possibility to add Micro Scratch, Nano Hardness and Micro Hardness modules.

Introduction to the Nanovea Series Nano Scratch Tester
The Nanovea Series Nano Scratch Tester’s ability to characterize the film/substrate system, and to quantify parameters such as friction force, and adhesive strength using a variety of complementary methods make it an invaluable tool for research, development and quality control. During the test a sharp metal tip or a Rockwell C diamond is drawn across the coated surface with an increasing load resulting in various types of failure at specific critical loads. Critical loads are identified optically using a built-in video microscope. Once known, these critical loads are used to quantify the adhesive and cohesive properties of different films/substrate combinations. Additionally, failure points can be determined by using frictional force and depth measurement. These parameters constitute a unique signature of the coating system under test.

The Nanovea Nano Scratch Tester exploits a normal force range to 500 mN, and is well suited for adhesion failure studies of thin films and coatings with thickness below 500 nm. With its long scratch path and very precise load control, the Nanovea Nano Scratch Tester is an important tool for the study of crack initiating and marring applications on all kinds of polymers such as varnish clear-coats used in the automobile industry. Substrate non-uniformities such as curvature, can be compensated for by performing a low load pre-scan which profiles the sample surface. This data is then used to adjust the scratch data for true depth. A similar post scratch profile reveals plastic and elastic properties of the film.

Nanovea Scratch Tester Analysis Software The Nanovea Scratch Tester Software is a complete software package for controlling test parameters such as: speed, loading rate and scratch length as well as analyzing test results.

Real time display of Acoustic Emission, Depth, Frictional Force versus Load (or displacement for constant load) Images incorporated directly into the scratch file for easy reference Precise correlation (Integrated Video Camera System) between measurement data and optical observation Associated load automatically indicated on the picture for easy identification Multi-pass scratch testing for the characterization of the wear properties of the coating Constant and progressive loads Control of all the parameters including speed, loading rate, and scratch length Zoom Functions Data export in ASCII format Latest Windows OS software User-friendly with free software updates

AFM Objective
An optional Atomic Force Microscope (AFM) objective can be fitted in addition to the standard optical microscope. As well as providing the most accurate determination of the contact area, high resolution AFM imaging close to, or within the indentation can provide valuable information about the mode of deformation in the material. The addition of a scanning probe microscope allows access to a whole new range of capabilities with the Nanovea Nano Indentation and Nanovea Scratch Testers, allowing the user to view features of the indentation such as pile-up, cracking, delamination, slip bands and other characteristics of failure in great detail. Unlike other AFM objectives, the Dualscope AFM avoids actual contact with the sample surface yet presents a very accurate image (to the <1nm) of the surface topology.

For contacts outside North America

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For Further information fill out our on-line request form or contact us at 1-866-333-4674: 

Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129