Introduction to Sarfus Technology
Sarfus Technology is a new optical quantitative imaging technique which utilizes an upright material optical microscope with polarized white light source. Sarfus visualization is based on the perfect control of the reflection properties of polarized light on a Surf (specific supporting plates where the sample is deposited), which leads to an increase in the axial sensitivity of the optical microscope by a factor around 100 without reducing its lateral resolution. A 3D image of the thin film optical thickness measurement is created through a colorimetric study of the Sarfus images.

Sarfus can be combined with other techniques such as AFM or RAMAN spectroscopy for total application synergy.

Surfs
Surfs are contrast-enhanced supports on which samples are deposited; the specific optical properties are due to precise control of the layers deposited on a substrate. It is possible to customize Surfs with specific top layers (SiO2, Au, Cr, Al…) that can be used in different environments.

Currently Surfs exist for observation in air or water. All Surfs, except the calibration standard, are designed for single-use. If an existing product does not fully meet your requirements, we can design and develop a custom Surf with specific top layer, support or lateral size.

Technique
Sarfus visualization results from a significant increase of optical microscope sensitivity.
To improve this sensitivity, the technique enhances the contrast of the object as compared to the background by minimizing the background intensity.

Using an upright optical microscope and specific Surf, a cross analyzer cuts off the reflected light. An infinitesimal quantity of matter on the surface of the Surf changes the property (i.e. modifies the polarization state) and reveals the sample.

For ultra-thin film samples of 10 nm thickness, contrast on Standard Surf is 25x better than using Si Wafers and 160x better for a sample of 1 nm thickness.

Process
A white light beam passes through a linear polarizer which produces a linear polarized light that is reflected by the Surf supporting the sample. Only the sample induces a change of the polarization state. The reflected beams pass through an analyzer crossed with the polarizer: the light reflected from the surf is stopped whereas the light reflected from the sample passes through. The resulting high contrast images allow direct observation of nanometric film thickness or nanometric object diameter. Sarfus gives also impressive results in reflected light Differential Interference Contrast "DIC" Microscopy.

Visualization Solutions

Plug and Play
The “Measurement Plug-In” is a “Plug and Play” solution which transforms your optical microscope into a fast and powerful nano-tool for ultra-thin films characterization:

Using Sarfus technology the “Measurement Plug-In” enables you to study dynamic phenomenon in 3D at the nanometer scale. The “Measurement Plug-In” and software package, allows you to manage every aspect of your experiment, from the images acquisition, to the presentation of your results.

Microscope
2 options of optical microscope have been specifically configured with Sarfus technology:

Light Microscope: A simple and reliable economical solution which features manual adjustment capabilities of the optical elements, light intensity, diaphragms, and objectives.

Digital Microscope: Recommended for use in SARFUS 3D mode this high-level microscope includes electronic adjustment of the light intensity, diaphragms, objective and an automatic recognition of the microscopy technique DIC, BF, DF.

Acquisition System
The acquisition system is an economical solution for visualization and/or detection and allows you to transfer your images to your PC for image analysis. Numerical and digital cameras are available, depending on your applications.

For Further information fill out our on-line request form or contact us at 1-866-333-4674: 

Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129