The
MultiView 1000TM
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Simultaneous
NSOM/AFM/Confocal Imaging |
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Normal
Force Sensing |
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Open
System Architecture -Transmission, Reflection,
and Collection Modes |
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Modular
and Customized Systems |
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Large
70 micron Z range |
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Integration
with Complementary Techniques |
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Wide
Range of Scanning Probes |
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Electrical
and Thermal Measurements |
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Ultimate
Flexibility |
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Advanced
Image Analysis |
The
award winning MultiView 1000TM is the first
system available that fully integrates all forms
of scanned probe microscopy with conventional
optical microscopy. Designed around patented
& award winning 3D FlatscanTM scanner
technology and incorporating sophisticated cantilevered
optical fiber probes, the instrument can simply
and transparently be combined with any inverted,
upright, or dual optical microscope.
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The
MultiView 1000™placed between the
objectives
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Schematic
diagram of NSOM system
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Normal
Force Sensing
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With
cantilevered optical fiber probes, the MultiView
1000TM system does away with much of the
complexity associated with near-field imaging.
Awkward shear-force techniques are a thing of
the past as the normal-force sensing capability
of the probe makes tip approach identical to
that used in ordinary atomic force microscopy.
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Large
Z Scan Range
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The
large, 70-micron x, y and z-range of the 3D
FlatscanTM. makes it ideal for optical sectioning
in confocal imaging. Used in this way, the MultiView
1000TM integrates conventional far-field
imaging, confocal microscopy, AFM, and near-field
optics in a single system.
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Open
System Architecture - reflection, transmission,
and collection imaging
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The
unique geometry of the NSOM head and cantilevered
probes leaves the optical axis free both above
and below the sample, allowing the user to view
the tip position during scanning and to perform
NSOM imaging in reflection, transmission, and
collection modes.
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AFM topography of DNA |
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SRAM using NSOM in reflection mode |
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SRAM using Electrical Resitance Imaging |
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Integration
with Complementary Techniques
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The
open system architecture also enables the MultiView
1000TM to be integrated with other instruments:
Commercial
micro-Raman microscopes, such as those developed
by Renishaw Plc. This combination permits correlation
of SPM topographic, thermal and electrical properties
of a sample surface with micro-Raman spectra.
In SEM/FIB systems the MultiView 1000TM can be simply and transparently placed inside
the SEM/FIB sample chamber providing simultaneous
AFM/SEM imaging.
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Electrical
and Thermal Measurements
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The
flexibility of the MultiView 1000TM also
makes it compatible with numerous types of specialized
SPM and NSOM probes. For example, the designed
wired probes that are capable of performing
simultaneous AFM and thermal measurements, NSOM/electrical/topographic
measurements, or AFM and electrical measurements,
such as spreading resistance and capacitance.
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Probes
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standard probes used in our systems are
cantilevered optical fibers. They provide
for normal force feedback, have unique advantages
in permitting a second channel of illumination
or collection, and allow transparent, integrated
and simultaneous far-field, lens-based imaging.
Straight NSOM fiber probes, micromachined
cantilevered NSOM probes and standard, silicon
AFM probes can also be used with the MultiView
1000T. In addition, customized fiber probes
are produced to customer specifications,
such as probes with tip lengths greater
than 500 mm for deep-trench probing and
probes with unique force constant and resonance
frequency combinations. |
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Complete
NSOM/AFM/Confocal Systems
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We
provide a complete NSOM/SPM microscopy system,
including a host microscope with confocal detection,
a control system, an illumination/detection
system, and the widest variety of additional
system accessories available on the market.
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Modular
& Customized Systems
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Another
important advantage of the MultiView 1000TM is its modularity. Because the system readily
sits on the sample stage of any conventional
far-field microscope and is compatible with
most commercial control systems, users can also
incorporate the MultiView 1000TM into pre-existing
microscopy systems. Our in-house team of experts
also works with each customer on a one-to-one
basis to provide customized solutions that suit
the particular requirements of the research
to be undertaken.
The MultiView 1000TM Integrated into the
vacuum chamber of a SEM
The MultiView 100TM Integrated onto a standard
Raman Microscope
The MultiView 1000TM inside an Environmental
Chamber for humidity and environmental control.
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Available
options for the MultiView 1000T
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Liquid
Cell - perform NSOM/AFM measurements on samples
in liquid.
Environmental Chamber - control your measurement
environment.
Nanochemical Delivery - deliver chemicals with
nanometer precision to your sample surface.
3D Nanolithography - software for lithography
applications.
For more options and additional details see
below.
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Closed
Loop Option
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With
the inclusion of embedded closed loop sensors,
the 3D Flat Scanner can return the sample to
a precise spot with an accuracy of 20 nm. This
is unaffected by hysteresis, creep, non-linearity
or aging of the piezoceramic.
Therefore,
the MultiView 1000TM with closed loop sensors
can perform linearization of the scanner both
on-line and off-line during a scan.
With
the addition of a third z-axis sensor the 3D
Flat ScannerTM can perform strictly horizontal
movement of the scanner. This can be essential
in particular in confocal imaging or when working
with certain liquid samples.
Overall,
the MultiView 1000TM is a robust and versatile
SPM system which allows the user to zoom, with
overlapping fields of view, from the lowest
resolutions of conventional far-field imaging
to the higher resolutions of confocal microscopy,
and finally, to the ultimate resolutions of
AFM and NSOM.
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infoca@microphotonics.com
