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  Nanovea ST400 / 3D Non-Contact Profiling

"Precision Surface Inspection"

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MicroTopography / Surface Roughness / Dimensional Metrology
Film Thickness Measurements / Form and Texture Surface Analysis
Precision Machining Quality Control / Industrial Surface Testing

Laboratory services available

See our full range of profilometers and roughness tester

Features of Nanovea ST400

  • Fast Non-Contact Technique
  • Economical Design
  • No Sample Preparation
  • High Z Axis Dynamic Range up to 27mm
  • High Z Resolution down to 2nm
  • Optical Lens Video/Microscope with various magnifications (option)
  • Able to Measure on Transparent Surfaces
  • Accepts a Wide Range of Materials
  • Rough or Polished Surfaces
  • Transparent or opaque objects
  • Ideal for metal, glass, wood, synthetic materials, scientific and ophthalmic optics, plastics, coatings, paints and varnishes, paper, human skin, hair, teeth...

Nanovea PS50 Compact Non-Contact Profilometer

Nanovea DS700 Dual Scanner for thickness measurement

Browse through more than 80 applications!

 

Nanovea ST400 Non-Contact Optical Profiler uses white light & the unique chromatic aberration technique. This technique has shown to be much better than laser techniques in measuring roughness. With accuracy in the nanometer range and a maximum measuring height range of up to 27mm, the Nanovea ST400 has the unique capability of not only be able to do very accurate roughness measurements but also can do dimensional measurements on the same instrument. Chromatic aberration technique has also the advantages of working for high angular slope conditions (up to 80degree for specular surfaces) and on samples with low reflectivity. Therefore the Nanovea ST400 works for a wider variety of applications compared to white light interferometry /phase shift and laser techniques. The Nanovea VS200 is a variation seen below that allows larger tables up to 300mm, rotation stage and other custom systems.

 

info@nanovea.com 

 

For Further information contact us at 1-866-333-4674

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