Nanovea ST400 Non-Contact Optical Profiler uses white light & the unique chromatic aberration technique. This technique has shown to be much better than laser techniques in measuring roughness. With accuracy in the nanometer range and a maximum measuring height range of up to 27mm, the Nanovea ST400 has the unique capability of not only be able to do very accurate roughness measurements but also can do dimensional measurements on the same instrument. Chromatic aberration technique has also the advantages of working for high angular slope conditions (up to 80degree for specular surfaces) and on samples with low reflectivity. Therefore the Nanovea ST400 works for a wider variety of applications compared to white light interferometry /phase shift and laser techniques. The Nanovea VS200 is a variation seen below that allows larger tables up to 300mm, rotation stage and other custom systems.

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