Micro Photonics Inc.

X-ray Fluorescence (XRF) is the phenomena of secondary X-ray emission from a material that is bombarded with higher energy X-rays. The secondary X-rays (or fluorescence) have unique energy characteristics that allow for elemental and chemical analysis by special energy-dispersive detectors.  The atoms within a sample consist of unexcited electrons in discrete energy levels (electron shells) that are bound to the nucleus. When high energy X-rays barrage the sample, some tightly bound inner electrons are ejected from their orbitals. The emission of an electron creates a “hole” or an unstable state in the atom that is then filled by a higher level electron. The drop in energy of the electron causes the release of a photon is a distinct energy profile.

Microtomography uses a similar technique as X-ray tomography systems used in medicine (CT Scans) but with much finer resolution. Multiple 2D X-ray images are stored while either the sample or the source / detector pair is rotated. Internal structures are reconstructed as a series of 2D cross sections which are then used to analyze the two and three dimensional morphological parameters of the object. The process is nondestructive and requires no special preparation of the specimen.

The powerful imaging capabilities of X-ray tomography are now available in a range of desktop instruments suitable for microscopic imaging of small objects with a wide range of applications: 3D bone analysis, food studies, soft tissue research, insects, microelectronics, materials, geological studies and more. Specialized software (CTAn) has been developed for the analysis of Micro-CT images including bone morphometry, porosity, fractal analysis and more (see related pages).