The
demand for ever-brighter sources is a growing trend across
the research and metrology communities who need increased
spatial and/or angular resolution without sacrificing precision,
reliability, or fast measurement times. These demanding
requirements cannot be satisfied by conventional X-ray sources
based on sealed tube technology, and rotating anode generators
are expensive solutions, especially considering the costly
maintenance they require.
GeniX
incorporates a high brilliance micro focus X-ray source
coupled with an industry proven single Bragg reflection
multilayer Xenocs optic to achieve optimal preservation
of the micro focus brilliance. The extreme stability and
reliability of GeniX make it ideal for integration into
systems for materials research, development, and production
control. GeniX is a versatile system with the performance
class of a conventional high power rotating anode source
and the reliability, low maintenance, and low capital and
operating cost of traditional sealed tubes.
Its
modular architecture allows GeniX to be configured with
the appropriate optic to shape the intense X-ray beam
as required in order to satisfy the demands of a wide
range of applications. System integrators have already
accepted GeniX for applications such as single crystal
diffraction and thin film metrology.
info@microphotonics.com