Standard AFM modes (all DualScope SPM Probe Scanner DS 95-series) |
| DC |
"contact mode", non-oscillating lever. |
| AC |
"non-contact mode", oscillating lever. Also called DME SenseMode = detection of oscillation amplitude and phase. |
| LFM |
Lateral Force Measurement mode. Measurement of the twisting of the probe in the longitudinal direction by means of quadrant detectors (friction force mode). |
| EFM |
Electrostatic Force Measurement. Measuring of the force interaction with the lever created by locally applying a charge to the surface. During scanning, the SPM probe will interact with the force created by the applied charge. |
| PCM |
Phase Contrast Mode. Measurement of phase shift signal as "contrast Mechanism". Very sensitive to small details in the surface (contrast function). |
| MFM |
Magnetic Force Measurement. Measurement of the magnetic active deflection of the AFM probe as a result of the interaction with magnetic layers on the SPM object. |
Advanced AFM modes (E-models only) |
| CEP |
Capacitance measurement performed in a single point as well as in multiple points with different distance on a nano meter scale to sample measurements in a pre-defined matrix, as well as during scanning. This mode is possible by using an external instrument (LCR meter) connected to the SPM system. |
| E-probing |
Electrical contact measurement by means of a nanoscale conductive tip. By means of an external analytical instrument connected to the SPM system it is possible to perform traditional electrical measurements such as impedance at different frequencies. |
| IND |
Inductance measurement performed in a single point as well as in multiple points with different distance on a nano meter scale to sample measurements in a pre-defined matrix, as well as during scanning. This mode is possible by using an external instrument (LCR meter) connected to the SPM system. |
| KEP |
Kelvin Probing with separate current and voltage in a single point as well as in multiple points in a pre-defined matrix up to 1024 x 1024 points X, Y for square scans. This mode is possible by using an external instrument connected to the SPM system. Two pin Kelvin probing with low stray capacitance - and thus high frequency - measurement is possible simultaneously with topographic measurements. |
| RES |
Resistance measurement performed in a single point as well as in multiple points with different distance on a nano meter scale to sample measurements in a pre-defined matrix, as well as during scanning. This mode is possible by using an external instrument (LCR meter) connected to the SPM system. |
| STM |
Scanning Tunneling Microscopy |
| STS |
Scanning Tunneling Spectroscopy |
| SUP |
Surface Potential (electrical) measurement performed in a single point as well as in multiple points with different distance on a nano meter scale to sample measurements in a pre-defined matrix as well as during scanning. This mode is possible by using an external instrument (electro meter) connected to the SPM system to measure the electrical potential. |
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infoca@microphotonics.com 
