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DS 95-50 & DS 95-200 SNOM Scanners
 

Features of the SNOM DS 95-50 & DS 95-200
  • Near-field optical microscope
  • Fits on all optical microscopes and various stages
  • Excellent Stability
  • High resolution model -50 50x50x2.7microns and large area model -200 for 200x200 x15microns

 

See Full Range of AFM/SPM, STM & SNOM Systems

Introduction to the DS 95-50 SNOM & DS 95-200 SNOM

The DS95-509 SNOM scanner is mainly for surface characterization of smaller samples of optical devices. The measuring volume is 50x50x15micron with 15micron in the z-direction. The DS95-200 SNOM scanner is mainly for the characterization of large plane samples of relatively high samples of optical devices. Despite its large measuring volume of 200x200x15micron, the scanner is capable of recording high quality images with a high scanning speed.

   
Specifications of the DualScope Scanner DS 95-50 & DS 95-200 SNOM
 
Specification

DS 95-50 SNOM

DS 95-200 SNOM

Scanner  
 
X,Y scan size:

50 x 50 micron

200 x 200 micron

 
Z range:
2.7 micron
15 micron
  ** These values can be significantly improved by calibration with relevant calibration standards for the measuring volume it is wished to use. If the scanning speed is kept at a constant value, the stated values can be improved by a factor of 2-5.
Vertical Accuracy  
 

Linearity:
By active linearization module better than 0.5% of full dynamic range
 

Resolution:
16-bit resolution, typically < 40 pm (rough sample), < 1 pm for flat samples with no physical slope
16-bit resolution, typically < 200 pm (rough sample), < 1 pm for flat samples with no physical slope
 
Offset:
Evaluated via sub-atomic step height on annealed GaN sample
 

Noise:
300 pm PP, < 30 pm RMS
Lateral Accuracy  
 

Linearity:
At 50% of full scale accuracy better than 1%
 

Resolution:

16-bit resolution on each axis < 80 pm

16-bit resolution on each axis < 300 pm
 
Offset:
Independent 16-bit
 

Noise:
< 2 nm RMS
< 5 nm RMS
Approach  

Type:
Automatic

Travel:

> 1.5 mm

 
Step Size:
> 1 micron
 
Precision:
> 50 nm
Operation  

Standard Modes:

SNOM

Physical Properties  

Weight (excl. cable):
250 g
 

Cable length:

2 m (other lengths available upon request)

 

Features of the SNOM Software

  • Plug and play support for all SNOM Microscopes
  • One-screen simultaneous measurement, analysis, and live video from CCD camera
  • Supports off-line data processing and data presentation
  • Automatic image enhancement
  • Automation support - SNOM Auto Control, scripting tool
  • Wizard-based instrument setup
  • Multiple software installations - no hardware lock or license key required

The SPM software is the standard software for operating all DualScope and Rasterscope Scanning Probe Microscopes, including SNOM and PolyScope Microscope for UHV measurements. The program is a combined data acquisition, data processing, data presentation, and measurement automation tool. SPM software can be combined with other image processing software like Mountain or SPIP. SPM software supports all standard and advanced modes, including simultaneous measurement and analysis, to ensure high productivity and great user satisfaction.

 

Thin Film Analysis infoca@microphotonics.com 
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Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129