AFM, SPM

DualScope Scanner, DS 95-50-E & 95-200-E

Features of the DS 95-50-E & DS 95-200-E

Equipped with infinitely corrected optics and standard 95 mm objective length
Scan volume of 40x40x2.7 micron with the 2.7 micron in the Z-direction
Fits on all optical microscopes and various stages
Excellent Stability
Probes are available with different tip geometry, tip length, resonance frequency, material, etc.

See Full Range of AFM/SPM, STM & SNOM Systems

Introduction to the DS 95-50-E & DS 95-200-E

The Special E-model scanners DS 95-200-E and DS 95-50E are capable of performing electrical measurements, e.g. Conductive AFM, STM, and many other modes, Electrical properties can be measured by connection of an LCR meter.


Virus	Polymer

Semiconductor	Data Storage

Specifications of the DualScope Scanner DS 95-50-E and DS 95-200-E

	Specification	DS 95-50-E	DS 95-200-E
Scanner
	X,Y scan size:	50 x 50 micron	200 x 200 micron
	Z range guaranteed:	2.7 micron	15 micron
	Z range actual:	3.5 micron	18 micron
	** These values can be significantly improved by calibration with relevant calibration standards for the measuring volume it is wished to use. If the scanning speed is kept at a constant value, the stated values can be improved by a factor of 2-5.
Vertical Accuracy
	Linearity:	By active linearization module better than 0.5% of full dynamic range
	Resolution:	16-bit resolution, typically < 40 pm (rough sample), < 1 pm for flat samples with no physical slope	16-bit resolution, typically < 200 pm (rough sample), < 1 pm for flat samples with no physical slope
	Offset:	Evaluated via sub-atomic step height on annealed GaN sample
	Noise:	300 pm PP, < 30 pm RMS
Lateral Accuracy
	Linearity:	At 50% of full scale accuracy better than 1%
	Resolution:	16-bit resolution on each axis < 80 pm	16-bit resolution on each axis < 300 pm
	Offset:	Independent 16-bit
	Noise:	< 2 nm RMS	< 5 nm RMS
Approach
	Type:	Automatic
	Travel:	> 1.5 mm
	Step Size:	> 1 micron
	Precision:	> 50 nm
Operation
	Standard Modes:	All Modes Except EC STM and SNOM
Objective
	Type:	Bright Field
	Focal Length:	95 mm
	Field of View:	1 x 0.75 mm
	Magnification:	15 X
	Resolution:	< 2 micron, 512 x 350 pixels
Physical Properties
	Weight (excl. cable):	250 g
	Cable length:	2 m (other lengths available upon request)

Features of the SPM Software

Plug and play support for all Scanning Probe Microscopes
One-screen simultaneous measurement, analysis, and live video from CCD camera
Supports off-line data processing and data presentation
Automatic image enhancement
Automation support - SPM Auto Control, scripting tool
Wizard-based instrument setup
Multiple software installations - no hardware lock or license key required

The SPM software is the standard software for operating all DualScope and Rasterscope Scanning Probe Microscopes, including SNOM and PolyScope Microscope for UHV measurements. The program is a combined data acquisition, data processing, data presentation, and measurement automation tool. SPM software can be combined with other image processing software like Mountain or SPIP. SPM software supports all standard and advanced modes, including simultaneous measurement and analysis, to ensure high productivity and great user satisfaction.

Applications	Functional Parameters
Bio Molecules	Structure
Semiconductors	Cross section
Cells	Morphology
DNA	Mechanical properties
Proteins	3D structure
Membrane structures	Bump size
Data storage devices	Roughness
Mechanical properties	Micro and nano scale electrical measurement on MEMS
Electrical measurements	Chain sizes/structures
Polymer	Radio frequency based electrical measurement
Thin films	Particle size
Coatings	Characterization
Viruses	Nano size
Nano wires
Nano particles

infoca@microphotonics.com

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Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc.
PO Box 3129
Allentown, PA 18106-0129