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DualScope Scanner, DS 95-50 & DS 95-200
 

Features of the DS 95-50 & DS 95-200
  • Easy to use with minimum time for tip change and adjustment
  • Fits on all optical microscopes and various stages
  • Excellent Stability
  • Probes are available with different tip geometry, tip length, resonance frequency, material, etc.
  • Built-in linearization module for the Z axis securing high linearity for the whole measuring range
  • Built-in bright field objective for simultaneous microscope observation
  • High resolution model -50 50x50x2.7microns and large area model -200 for 200x200 x15microns

See Full Range of AFM/SPM, STM & SNOM Systems

Introduction to the DS 95-50 & DS 95-200

This AFM scanner DS 95-50 is for applications where there is a need to measure the height of local areas for conductive and non-conductive surfaces, on sample areas of maximum 50x50microns. The scanner is, Z-linearized, has infinitely corrected optics and standard 95mm objective length and it fits on all optical microscopes. The main applications for this scanner are surface topography on conductive and non-conductive surfaces.

The DS95-200 AFM scanner is for those application where a larger measuring volume is needed. The scanner is Z-linearized, so this is the choice for users who wish to measure the height of the scanned sample up to 15micron in height and 200x200microns.

   
Specifications of the DualScope Scanner DS 95-50 & DS 95-200
 
Specification

DS 95-50

DS 95-200
Scanner  
 
X,Y scan size:

50 x 50 micron

200 x 200 micron

 
Z range guaranteed:
2.7 micron
15 micron
 

Z range actual:

3.5 micron

18 micron
  ** These values can be significantly improved by calibration with relevant calibration standards for the measuring volume it is wished to use. If the scanning speed is kept at a constant value, the stated values can be improved by a factor of 2-5.
Vertical Accuracy  
 

Linearity:
By active linearization module better than 0.5% of full dynamic range
 

Resolution:
16-bit resolution, typically < 40 pm (rough sample), < 1 pm for flat samples with no physical slope
16-bit resolution, typically < 200 pm (rough sample), < 1 pm for flat samples with no physical slope
 
Offset:
Evaluated via sub-atomic step height on annealed GaN sample
 

Noise:
300 pm PP, < 30 pm RMS
Lateral Accuracy  
 

Linearity:
At 50% of full scale accuracy better than 1%
 

Resolution:

16-bit resolution on each axis < 80 pm

16-bit resolution on each axis < 300 pm
 
Offset:
Independent 16-bit
 

Noise:
< 2 nm RMS
< 5 nm RMS
Approach  

Type:
Automatic

Travel:

> 1.5 mm

 
Step Size:
> 1 micron
 
Precision:
> 50 nm
Operation  

Standard Modes:

PCM, MFM, LFM, EFM, AFM AC and AFM DC

Objective  

 
Type:
Bright Field
 
Focal Length:
95 mm
 
Field of View:
1 x 0.75 mm
 
Magnification:
15 X

Resolution:
< 2 micron, 512 x 350 pixels
Physical Properties  

Weight (excl. cable):
250 g
 

Cable length:

2 m (other lengths available upon request)

 

Features of the SPM Software

  • Plug and play support for all Scanning Probe Microscopes
  • One-screen simultaneous measurement, analysis, and live video from CCD camera
  • Supports off-line data processing and data presentation
  • Automatic image enhancement
  • Automation support - SPM Auto Control, scripting tool
  • Wizard-based instrument setup
  • Multiple software installations - no hardware lock or license key required

The SPM software is the standard software for operating all DualScope and Rasterscope Scanning Probe Microscopes, including SNOM and PolyScope Microscope for UHV measurements. The program is a combined data acquisition, data processing, data presentation, and measurement automation tool. SPM software can be combined with other image processing software like Mountain or SPIP. SPM software supports all standard and advanced modes, including simultaneous measurement and analysis, to ensure high productivity and great user satisfaction.

 

Applications
Functional Parameters
Bio Molecules
Structure
Semiconductors
Cross section
Cells
Morphology
DNA
Mechanical properties
Proteins
3D structure
Membrane structures
Bump size
Data storage devices
Roughness
Mechanical properties
Micro and nano scale electrical measurement on MEMS
Electrical measurements
Chain sizes/structures
Polymer
Radio frequency based electrical measurement
Thin films
Particle size
Coatings
Characterization
Viruses
Nano size
Nano wires
Nano particles

 

Thin Film Analysis infoca@microphotonics.com 
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Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129