|
|
||||||||||||||
DualScope Scanner, DS 45-40 SNOM
|
|
Features
of the DS 45-40 SNOM
|
Introduction to the DS 45-40 SNOM
|
Specifications
of the DualScope Scanner DS 45-40 |
Specification |
DS 45-50 SNOM |
|
| Scanner | ||
X,Y scan size: |
40 x 40 micron |
|
X,Y resolution: |
< 1 nm |
|
Z range: |
2.7 micron |
|
Z resolution: |
< 1 nm (depending on stage) |
|
| Linearity | ||
X direction: ** |
0.7 % |
|
Y direction: ** |
2.7 % |
|
Z direction: ** |
10 % |
|
| ** These values can be significantly improved by calibration with relevant calibration standards for the measuring volume it is wished to use. If the scanning speed is kept at a constant value, the stated values can be improved by a factor of 2-5. | ||
| Approach | ||
Type: |
Automatic |
|
Length: |
> 1.5 mm |
|
Operation |
|
|
Standard Modes: |
SNOM |
|
| Physical Properties | ||
Weight (excl. cable): |
140 g |
|
Cable length: |
2 m |
|
Cable Jacket: |
Medical PVC |
|
![]() |
Features of the SNOM Software
|
|
The SPM software is the standard software for operating all DualScope and Rasterscope Scanning Probe Microscopes, including SNOM and PolyScope Microscope for UHV measurements. The program is a combined data acquisition, data processing, data presentation, and measurement automation tool. SPM software can be combined with other image processing software like Mountain or SPIP. SPM software supports all standard and advanced modes, including simultaneous measurement and analysis, to ensure high productivity and great user satisfaction. |
|
| [Return to Micro Photonics home page] [Return to AFM, SPM, & SNOM Systems menu]
For Further information fill out our on-line request form or contact us at 1-866-333-4674
Micro Photonics Inc. Micro Photonics Inc.
|