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DualScope Scanner, DS 45-40
 

Features of the DS 45-40
  • Equipped with infinitely corrected optics and standard 45 mm objective length
  • Scan volume of 40x40x2.7 micron with the 2.7 micron in the Z-direction
  • Fits on all optical microscopes and various stages
  • Excellent Stability
  • Probes are available with different tip geometry, tip length, resonance frequency, material, etc.
  • Optional on Nanovea Nano Hardness Tester and Nanovea Nano Scratch Tester

See Full Range of AFM/SPM, STM & SNOM Systems

   

Introduction to the DS 45-40


The unique design of the DS45-40 makes it a tool of choice for OEM application such as in nano-indentation, optical and electron microscopy. It can also be used as a stand-alone tool for surface characterization of virtually any type of materials.

 
   
Specifications of the DualScope Scanner DS 45-40
 
Specification
DS 45-50
Scanner  
 
X,Y scan size:

40 x 40 micron

 
X,Y resolution:

< 1 nm
 

Z range:

2.7 micron

 

Z resolution:

< 1 nm (depending on stage)

Linearity  

X direction: **

0.7 %

 

Y direction: **

2.7 %

 

Z direction: **

10 %

  ** These values can be significantly improved by calibration with relevant calibration standards for the measuring volume it is wished to use. If the scanning speed is kept at a constant value, the stated values can be improved by a factor of 2-5.
Approach  

Type:
Automatic

Length:

> 1.5 mm

Operation

 

Standard Modes:

PCM and AFM AC
Objective  

 
Type:
Bright Field
 
Focal Length:
45 mm

Magnification:
15X
Physical Properties  

Weight (excl. cable):
140 g
 

Cable length:

2 m
 
Cable Jacket:
Medical PVC

 

Features of the SPM Software

  • Plug and play support for all Scanning Probe Microscopes
  • One-screen simultaneous measurement, analysis, and live video from CCD camera
  • Supports off-line data processing and data presentation
  • Automatic image enhancement
  • Automation support - SPM AutoControl, scripting tool
  • Wizard-based instrument setup
  • Multiple software installations - no hardware lock or license key required

The SPM software is the standard software for operating all DualScope and Rasterscope Scanning Probe Microscopes, including SNOM and PolyScope Microscope for UHV measurements. The program is a combined data acquisition, data processing, data presentation, and measurement automation tool. SPM software can be combined with other image processing software like Mountain or SPIP. SPM software supports all standard and advanced modes, including simultaneous measurement and analysis, to ensure high productivity and great user satisfaction.

 

Applications
Functional Parameters
Bio Molecules
Structure
Semiconductors
Cross section
Cells
Morphology
DNA
Mechanical properties
Proteins
3D structure
Membrane structures
Bump size
Data storage devices
Roughness
Mechanical properties
Micro and nano scale electrical measurement on MEMS
Electrical measurements
Chain sizes/structures
Polymer
Radio frequency based electrical measurement
Thin films
Particle size
Coatings
Characterization
Viruses
Nano size
Nano wires
Nano particles

 

Thin Film Analysis infoca@microphotonics.com 
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Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129