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Advanced Solutions - AFM/SPM, STM & SNOM
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Features
of the Advanced Systems
Call us for specific requirements |
| Introduction to the Advanced Solutions Systems The new PolyScope 50, seen above, is a UHV system with built-in Scanning Tunneling Microscope (STM). The PolyScope 500 is specially designed to support highly efficient light excitation and detection at the tip-sample interface. The system is designed with the following characteristics:
The CAHT-SPM, Controlled Atmosphere High Temperature SPM, is designed for in-situ investigations of electrical surface reactions at very high temperatures. The temperature range is 300-1100 Kelvin, using a specially designed AFM probe. The CAHT-SPM is a water-cooled sample scanner with an environmental enclosure. This system is capable of scanning with high stability (<0.03° C), while heating samples up to 1100 K. The CAHT-SPM contains programmable ramps for AFM/STM measurements in the controlled atmosphere. |
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For Further information fill out our on-line request form or contact us at 1-866-333-4674
Micro Photonics Inc. Micro Photonics Inc.
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