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Advanced Solutions - AFM/SPM, STM & SNOM
 

Features of the Advanced Systems
  • Controlled Atmosphere
  • High Temperature (up to 1100 K)
  • High Vacuum
  • Liquid Environment

 

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See Full Range of AFM/SPM, STM & SNOM Systems

Introduction to the Advanced Solutions Systems

The new PolyScope 50, seen above, is a UHV system with built-in Scanning Tunneling Microscope (STM). The PolyScope 500 is specially designed to support highly efficient light excitation and detection at the tip-sample interface. The system is designed with the following characteristics:

  • Ready-to-run vacuum system
  • In-vacuum tip exchange mechanism
  • In-vacuum sample exchange mechanism
  • Plenty of room for user-defined equipment
  • 5-axis manipulator between scanner and sample, holding an optical half-sphere mirror

The CAHT-SPM, Controlled Atmosphere High Temperature SPM, is designed for in-situ investigations of electrical surface reactions at very high temperatures. The temperature range is 300-1100 Kelvin, using a specially designed AFM probe. The CAHT-SPM is a water-cooled sample scanner with an environmental enclosure. This system is capable of scanning with high stability (<0.03° C), while heating samples up to 1100 K. The CAHT-SPM contains programmable ramps for AFM/STM measurements in the controlled atmosphere.

   

 

Thin Film Analysis infoca@microphotonics.com 
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Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129