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Powerful Mountain Analysis Software 

ULTRA, EXPERT and PROFESSIONAL Exclusive Versions

Main Features

  • 2D & 3D features
  • Cutting edge technology in analysis & visualization
  • Standardized methods & parameters
  • Easily adaptable with Mountains Contour, Mountain Skins & Mountains Form
  • Reads almost all types of files from known non-contact and contact profilometry systems and AFM systems
  • Quick Turnaround on purchase & Multiple Licences Discount

Laboratory services available. Call 1-866-333-4674 for more information.

Click here for Nanovea ST400, Nanovea DS700, Nanovea PS50

See our full range of profilometers and roughness testers

Powerful New Software

Mountain Analysis Software is a powerful software tool for analyzing 2D & 3D profiles while delivering an eye catching report.  It includes cutting edge technology in analysis and visualization, including standardized methods and parameters. 

We offer three exclusive levels of capability for the 3D called the ULTRA, EXPERT and PROFESSIONAL for the 2D we offer Professional version.

 
3D Features
  • Pseudo-color or pseudo-photo 3D & 2D images
  • Contour diagram
  • 3D lined representation & 3D continuous representation
  • Depth distribution, Abbott-Firestone curve in 3D
  • 3D parameters from the BCR report
  • Fractal analysis
  • Peak distribution
  • Angle measurement, distance measurement
  • Material and void volume between two slices
  • Hole analysis, power spectrum analysis, Autocorrelation
  • Geometrical Transformation: zoom, inversion, symmetries
  • Leveling, form removal (polynomial, sphere, cylinder)
  • 3D Gaussian filtering, median filtering, convolution filtering
  • 3D step height, angle between two planes
  • Profile extraction (cross-section) in any direction
  • Cylindrical Stitching
2D Features
  • Display of roughness and waviness prodiles (gaussian, RC2-ISO, RC2-PC)
  • Depth distribution and Abbott-Firestone curve
  • Spectrum analysis and Power Spectrum Density
  • Fractual Analysis
  • Distance Measurement, Step Height Measurement
  • Roughness parameters: Ra, Rt, Rp, Rv. Rq, Rsk, Rku, Rz, RSm, Rc, RTp, RHTp, RDq, RLq, RzJIS, PC, HSC, RLo, R3z, Rtm, Ry and their equivalent on raw and waviness profiles.
  • Form removal, least square line or minimum zone leveling

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For Further information fill out our on-line request form or contact us at 1-866-333-4674: 

 

Micro Photonics Inc.
PO Box 50443
Irvine, CA 92619-0443

Micro Photonics Inc. 
PO Box 3129 
Allentown, PA 18106-0129