| Energy
Dispersive X-Ray Fluorescence |
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- Compact
self contained EDX systems for field and laboratory
- Measure
material composition.
- Measure
coating thickness.
- Easy
to use.
- Many
applications - Industrial
components, geology, biology, chemistry, aerospace, NDT,
quality control, inspection
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- Model
EDX600
- Compact
self contained table top instrument
- Ready
programmed for metals: Au Ag Cu Zn Ni Pd Pt Rh Cd Ru
- Measure
material composition.
- Measure
coating thickness.
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- Model
EDX6600
- Compact
self contained table top instrument
- Elements
in the range: K-U
- Measure
elemental composition 1ppm to 99.99%
- Measure
coating thickness.
- High
resolution Silicon PIN Diode Detector
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- Model
EDX3000
- Elements
in the range: Na to U, or K to U (model A or B)
- Measure
elemental composition 1ppm to 99.99%
- Ideal
for RoHS inspection of Hg, Pb, Cd, Cr, Br
- High
resolution Silicon PIN Diode Detector
- Use
for solids powders or liquids
- Sample
chamber can be put under vacuum
- Compact
self contained table top instrument
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